Bug #111214
【Figure】【EVT】【SI】RGMII:LAN_RXD&LAN_TXD0 thd不满足规格要求,LAN_TX_CLK上升下降时间超规格要求,TXD数据在采样点位置均在跳变
Status: | CLOSED | Start date: | 2022-08-11 | |
---|---|---|---|---|
Priority: | High | Due date: | ||
Assignee: | SZ HW Test-曾小文 | % Done: | 0% | |
Category: | EE | |||
Target version: | - | |||
Need_Info: | -- | Found Version: | 2022.08.07 | |
Resolution: | -- | Degrated: | -- | |
Severity: | Major | Verified Version: | ||
Reproducibility: | Every time | Fixed Version: | ||
Test Type: | Release Test | Root cause: |
Description
RGMII:LAN_RXD&LAN_TXD0 thd规格要求大于2.7ns,RXD实测1.4ns左右,TXD0实测0.425ns
LAN_TX_CLK上升下降时间规格要求小于0.75ns,实测0.9ns左右
History
#1 Updated by SZ HW Test-曾小文 almost 3 years ago
- Assignee set to SZ-硬件二组_SD3 王苗
#2 Updated by SZ HW Test-曾小文 almost 3 years ago
- Subject changed from RGMII:LAN_RXD&LAN_TXD0 thd不满足规格要求,LAN_TX_CLK上升下降时间超规格要求 to 【Figure】【EVT】【SI】RGMII:LAN_RXD&LAN_TXD0 thd不满足规格要求,LAN_TX_CLK上升下降时间超规格要求
#3 Updated by CD TPM-申艳艳 almost 3 years ago
- Category set to EE
#4 Updated by SZ HW Test-曾小文 almost 3 years ago
- Subject changed from 【Figure】【EVT】【SI】RGMII:LAN_RXD&LAN_TXD0 thd不满足规格要求,LAN_TX_CLK上升下降时间超规格要求 to 【Figure】【EVT】【SI】RGMII:LAN_RXD&LAN_TXD0 thd不满足规格要求,LAN_TX_CLK上升下降时间超规格要求,TXD数据在采样点位置均未稳定
上升下降时间在芯片脚测试PASS,更新软件后thd复测PASS,但是TXD数据在采样点位置均在跳变。
#5 Updated by SZ HW Test-曾小文 almost 3 years ago
- Subject changed from 【Figure】【EVT】【SI】RGMII:LAN_RXD&LAN_TXD0 thd不满足规格要求,LAN_TX_CLK上升下降时间超规格要求,TXD数据在采样点位置均未稳定 to 【Figure】【EVT】【SI】RGMII:LAN_RXD&LAN_TXD0 thd不满足规格要求,LAN_TX_CLK上升下降时间超规格要求,TXD数据在采样点位置均在跳变
#6 Updated by SZ-硬件二组_SD3 王苗 over 2 years ago
- Status changed from New to RESOLVED
- Assignee changed from SZ-硬件二组_SD3 王苗 to SZ HW Test-曾小文
与硬测一起重新复测,时序满足规格书要求,确认OK。
#7 Updated by SZ HW Test-曾小文 over 2 years ago
- Status changed from RESOLVED to VERIFIED
RGMII:LAN_RXD&LAN_TXD0 thd不满足规格要求,LAN_TX_CLK上升下降时间超规格要求:上升下降时间在芯片脚测试PASS,更新软件后thd复测PASS,但是TXD数据在采样点位置均在跳变:研发回复88Q2112内部有delay,信号终端会加delay。
#8 Updated by SZ HW Test-曾小文 over 2 years ago
- Status changed from VERIFIED to CLOSED