Bug #111417
【Figure】【EVT】【SI】AD2428WCCSZ上电时序VDVDD/VIODVDD与VIN反序,Vin 无Tporst拉低。
Status: | CLOSED | Start date: | 2022-08-23 | |
---|---|---|---|---|
Priority: | High | Due date: | ||
Assignee: | SZ HW Test-曾小文 | % Done: | 0% | |
Category: | EE | |||
Target version: | - | |||
Need_Info: | -- | Found Version: | 2022.08.19 | |
Resolution: | -- | Degrated: | -- | |
Severity: | Major | Verified Version: | ||
Reproducibility: | Every time | Fixed Version: | ||
Test Type: | Release Test | Root cause: |
Description
From To Test Point SPEC Test Result
Min Typ Max Units Measured Value Pass / Fail Notes
VDVDD VIN C12253 to TP10452 0 - - ms -0.9338 Fail
VIODVDD VIN C12255 to TP10452 0 - - ms -0.93378 Fail
VIN VIN TP10452 25 - - ms 0 Fail
History
#1 Updated by SZ-硬件二组_SD3 王苗 almost 3 years ago
这个电源不是外部供电,电源为芯片本身产生的。测试case与设计不符合
#2 Updated by SZ-硬件二组_SD3 王苗 almost 3 years ago
- Assignee changed from SZ-硬件二组_SD3 王苗 to SZ HW Test-曾小文
VDVDD VIODVDD 电源不是外部供电,电源为芯片本身产生的。芯片只有一个VIN供电。测试case与设计不符合。
#3 Updated by 项目二组_SD3 曾小文 almost 3 years ago
- Status changed from New to RESOLVED
8/23:VDVDD/VIODVDD为内部供电,研发评估不关注时序
#4 Updated by 项目二组_SD3 曾小文 almost 3 years ago
- Status changed from RESOLVED to VERIFIED
#5 Updated by 项目二组_SD3 曾小文 almost 3 years ago
- Status changed from VERIFIED to CLOSED
#6 Updated by CD TPM-申艳艳 almost 3 years ago
- Category set to EE