Bug #111739
【Figure】【EVT】【电气性能】E19 击穿强度：击穿，试验后，重新上电，运行操作指令，功能正常
| Status: | CLOSED | Start date: | 2022-09-05 | |
|---|---|---|---|---|
| Priority: | High | Due date: | ||
| Assignee: | SZ HW Test-曾小文 | % Done: | 100% | |
| Category: | EE | |||
| Target version: | - | |||
| Need_Info: | -- | Found Version: | 2022.08.25 | |
| Resolution: | -- | Degrated: | -- | |
| Severity: | Normal | Verified Version: | ||
| Reproducibility: | Every time | Fixed Version: | ||
| Test Type: | Release Test | Root cause: |
History
#1 Updated by SZ-硬件二组_SD3 王苗 almost 3 years ago
- Status changed from New to NEED_INFO
- Assignee changed from SZ-硬件二组_SD3 王苗 to SZ HW Test-曾小文
击穿强度本产品外壳接GND，外部接插件连接器没有空PIN,所有PIN都与GND之间有电气连接。本实验不适用本产品，开会客户已经承人。请出实验室报告给客户的时候再跟客户确认一遍。
#2 Updated by SZ HW Test-曾小文 almost 3 years ago
- Status changed from NEED_INFO to RESOLVED
#3 Updated by SZ HW Test-曾小文 almost 3 years ago
- Status changed from RESOLVED to VERIFIED
实验要求PIN脚对空PIN测试，但是本设备所有PIN均不为空PIN,不适应，客户承认不测。
#4 Updated by SZ HW Test-曾小文 almost 3 years ago
- Status changed from VERIFIED to CLOSED
#5 Updated by CD TPM-申艳艳 almost 3 years ago
- Category set to EE
- % Done changed from 0 to 100